| Referanse |
Kohler, A., Sulé-Suso, J., Sockalingum, G.D., Tobin, M., Bahrami, F., Yang, Y., Pijanka, J., Dumas, P., Cotte, M., van Pittius, D.G., Parkes, G., Martens, H. 2008. Estimating and correcting Mie scattering in synchrotron-based microscopic FTIR spectra by extended multiplicative signal correction (EMSC). Applied Spectroscopy, Vol 62, Issue 3, pp 259-266. |